Ideal for material-defect analysis and quality-audit workflows, this 4K Ultra HD High-Magnification Metallurgical Microscope is a competitive High magnification metallographic microscope with 4K Ultra HD. Dual viewing via binocular eyepieces and external monitor allows convenient team review. Wireless data transfer can be realized by plugging a wireless adapter into its USB port. Uniform coaxial lighting together with bright-field and dark-field modes delivers sharp visibility for grains, coatings, cracks and other tiny flaws. Built-in image capture and measurement-analysis functions streamline inspection workflows. Anti-vibration chassis maintains consistent picture quality; upgrade-friendly modular layout cuts future hardware investment.
4K camera integrated with trinocular metallurgical frame, supports simultaneous eyepiece and screen viewing. Dual output of HDMI + Gigabit-LAN port to capture ultra-HD micro-images in real-time.
Optical magnification 50-500 ×, maximum digital magnification 2000 ×. Precision optical path with professional metallurgical objectives delivers sharp imaging of micro-metal textures.
Integrated coarse-and-fine focusing unit ensures smooth and stable focusing, greatly reducing image vibration during observation.
One-piece cast-aluminum base keeps the unit well-balanced, free of wobble or shift during long-time slice-inspection and material-observation work.
Classic white-and-blue research-style body with standard trinocular metallurgical layout, clean and minimalist for laboratories and quality-inspection workshops.
Suitable for metal-metallographic analysis, semiconductor-wafer inspection, material-failure-analysis, university-teaching-research and component-quality-testing tasks.
4K (3840 × 2160) photo and video capture. Built-in on-monitor measurement and PC-software-based measurement are available; dual-storage via USB flash-drive and computer. Secondary-development is supported for convenient image-archiving, comparison and in-depth data-analysis.
Binocular viewing & synchronous electronic observation: Synchronized display between eyepiece and monitor. Ordinary metallurgical microscopes only support eyepiece-only viewing; extra camera accessories are needed for screen output.
4K ultra-high-definition imaging: 3840 × 2160 4K resolution for fine-microstructure reproduction. Common metallurgical cameras are mostly 1080P with limited clarity.
Dual-output interfaces: HDMI + Gigabit-LAN port. Traditional metallurgical devices usually only connect to PC without network-port for device integration.
Dual-measurement modes: Offline built-in measurement on-monitor plus PC-software-based measurement. Ordinary metallurgical microscopes only support PC-side measurement without hardware-embedded measuring function.
Dual-storage modes: Offline USB-flash-drive storage and PC-software storage; data saving available with or without computer. Conventional models require PC for image saving.
Secondary-development supported: Gigabit-LAN port enables system integration for automation-production-line deployment. General metallurgical microscopes do not support secondary-development integration.
Dedicated metallurgical optical path: Optimized for analysis of metal, coating and grain-structure. Ordinary digital microscopes lack dedicated metallurgical optical path and cannot observe metallurgical micro-structures.
Equipped with a native 4K (3840 × 2160) industrial camera and professionally calibrated with standard metallurgical-test specimens, the system produces ultra-clear, evenly-focused images. It accurately restores intricate micro-structures including grain boundaries, layered coatings and micro-fractures with consistent sharpness from center to edge.
Configured with multiple achromatic metallurgical objectives for high-magnification micro-analysis. The dual-view trinocular design supports synchronous eyepiece viewing and digital-monitor display, perfectly fitting industrial scenarios such as metal-material-identification, coating-thickness-inspection and grain-quality-grading.
Built-in professional-measurement algorithm enables on-screen data overlay and high-precision metallurgical-measurement. It covers multiple key indicators including coating thickness, grain length, crack width and inter-layer spacing, while supporting real-time annotation, image-archiving and test-data-export. Compatible with depth-of-field stacking and image-stitching functions.
Dual-path transmitted-and-reflected illumination guarantees qualified lighting for diverse specimen types. The high-precision movable stage ensures flexible and precise field-positioning. Reinforced full-metal body effectively eliminates vibration, delivering steady performance for long-duration batch-material-detection.
Semiconductor & Electronic Components: IC chips, silicon wafers, photolithography slices, PCB boards, FPC flexible boards, solder joints, pins. Inspection targets: Observe internal chip circuits, wafer coatings, cold-solder defects, oxidation, circuit scratches and pin deformation; analyze micro-slice structures under max 2000 × magnification.
Metal Materials & Metallographic Specimens: Metallographic slices, stamped-metal hardware. Inspection targets: Metallographic-grain-structure analysis, heat-treatment-material-identification; detect edge-chipping, micro-cracks, burrs and abrasion depth.
LED Optoelectronic & Plastic-Molded Parts: LED chips, optical-plastic parts, injection & die-cut products. Inspection targets: Inspect tiny notches, surface stains, rough edges, micro-foreign particles, glue-delamination and sealing micro-defects.
High-Precision Miniature Components: Connectors, terminals, micro-springs, tiny stamped workpieces. Inspection targets: Observe tiny gaps and crimp flatness; perform pixel-level precise measurement of length, hole-diameter and pitch.
Laboratory & Industrial QC Archiving: Metallographic-slice-experiment-analysis, incoming-&-finished-goods sampling-inspection; photo-&-video-archiving for defective-evidence records and export of formal-measurement QC reports.
Optical magnification ranges 50 ×-500 ×, max digital magnification up to 2000 ×, with native 3840 × 2160 4K resolution. It clearly displays metallographic textures, chip coatings and tiny grains, ideal for micro-analysis of metal-metallographic-structures, wafers, coatings and powder-materials for material-labs and semiconductor-incoming- inspection.
Trinocular optical-path enables simultaneous viewing via binocular eyepieces and monitor. Multiple operators can check micro-samples together, perfect for university-training and double-inspection of defects in factories.
Equipped with HDMI + Gigabit-LAN ports. HDMI connects monitor for on-site viewing; LAN port supports local-area-network access for remote-image-access and multi-station-synchronous-monitoring, realizing centralized-equipment-management for large-scale-labs.
Two-measurement-solutions: built-in on-monitor measurement and PC-software-based measurement. Two-storage-ways: USB flash-drive storage and computer-archiving. Measured-data and 4K-images can be exported for QC-reports, and the device supports secondary-development for production-line-integration.
Standard metallurgical-stage with multiple objective-lenses fits metal-samples, wafers, coating-slices and micro-electronic-parts. Precision coaxial coarse-and-fine manual-focusing with stable body, widely used in teaching, incoming-inspection and new-material-research.
Neutral-packing shipment is available upon request.
| Entity | Description |
| Product | GP-L200-324K 4K High magnification metallographic microscope with 4K Ultra HD |
| Category | Industrial Trinocular High-Magnification 4K Metallographic Inspection & Measuring Microscope |
| Core Technologies | Trinocular synchronous-observation optical-system, professional metallurgical objective-lens group, 4K ultra-high-definition CMOS imaging, dual-digital-measurement engine (on-screen & PC-software), HDMI + Gigabit-LAN dual-signal-transmission, dual-storage-technology, open-system supporting secondary-development |
| Key Specs | Visual magnification: 50/100/200/500 ×; Electronic magnification: 200/400/800/2000 ×; Dual-output: HDMI + Gigabit-LAN; 4K capture resolution 3840 × 2160; Manual-focusing; Dual-measurement-modes: built-in on-device measurement + professional-PC-software measurement *(0.001 mm, Smaller measurement tolerance can be achieved under higher magnification. Results subject to calibration, magnification and sample conditions)*; Dual-storage: USB-flash-drive local-storage + computer-file-storage; Monitor-terminal supports image-preview, dimensional-measurement, photo-capture & file-save; PC-terminal supports measurement and image-archiving, compatible with secondary-development-integration |
| Typical Applications | Metal-metallographic-structure-analysis, alloy-grain-&-material-texture-observation, coating-thickness-measurement, semiconductor-wafer-detection, PCB cross-section-inspection, precision-hardware-failure-analysis, university-laboratory-material-research, new-energy-material-quality- testing |
| Manufacturer | Kunshan Gaopin Precision Instrument Co., Ltd. |
| Manufacturer Location | Kunshan, Jiangsu, China (near Shanghai) |
| Product brand | GAOPIN |
| Product Model | GP-L200-324K |
| Resolution | 3840 × 2160 (4K) |
| Effective Pixels | 8.3-megapixel |
| Focusing method | Manual focus (coaxial coarse-and-fine adjustment) |
| Sensor optical format | 1/1.7" |
| Pixel size | 1.85 μm × 1.85 μm |
| Output interfaces | HDMI + Gigabit-LAN |
| Frame rate |
HDMI: 60 fps @3840 × 2160 LAN port: 20 fps @1920 × 1080 |
| Measurement operation | Built-in on-monitor measurement system + PC-software-based measurement |
| Measurement accuracy | 0.001 mm *(Smaller measurement tolerance can be achieved under higher magnification. Results subject to calibration, magnification and sample conditions)* |
| Measurement units | mm / μm / mil / inch (4-way switchable) |
| Measurement tools | Length, angle, radius, circle, polygon, polyline, center-to-center distance, rectangle, annotation, auto-edge detection, scale bar |
| Storage method | USB flash-drive + PC-software storage |
| Image-naming mode | Automatic or manual image-file naming |
| Display language | Simplified Chinese / English (switchable) |
| Processor | ARM Cortex-A17 Quad-Core @ Max.1.4 GHz main-control processor |
| Firmware OS | Independently-developed measurement system built on Linux 3.1 kernel |
| Observation head | 30° inclined trinocular observation tube, 360° rotatable, adjustable interpupillary distance |
| Observation method | Bright-field / oblique-lighting / transmitted-lighting / simple polarization |
| Lighting system | Reflected & transmitted dual-path illumination system, 100-240 V wide-voltage; adjustable filament-center, continuously-adjustable light-intensity |
| Stand framework | Dual-purpose transmitted-and-reflected rack; coaxial coarse-fine focus mechanism; coarse-adjustment stroke 33 mm, fine-adjustment accuracy 0.002 mm with locking & limit-stop; halogen-lamp illumination; Bright-field reflector with variable-aperture stop, field-stop and color-filter-conversion; Equipped with blue filter for reflected-light observation |
| Mobile platform | Double-layer mechanical-moving stage; stage size: 140 × 132 mm; X-Y stroke: 76 × 50 mm; glass stage for transmitted & reflected observation |
| Light source | 6V-30W halogen-lamp for reflected-light; 6V-30W halogen-lamp for transmitted-light |
| Simple-polarization | 30° polarizer insert (reflected-light) + 360°-rotatable analyzer insert for polarized observation |
| Electronic interface | 0.5X C-mount interface, adjustable focus [Optional: 1X C-mount] |
| Eyepiece | High-eye-point large-field flat-field eyepiece PL10X/18 mm (one eyepiece with scale mark) |
| Metallurgical objective lens | Long-working-distance flat-field achromatic metallurgical objectives: 5X / 0.13 WD15.5 mm; 10X / 0.25 WD8.7 mm; 20X / 0.40 WD8.8 mm; 50X / 0.60 WD5.1 mm |
| Optical magnification | 50 ×, 100 ×, 200 ×, 500 × four-level adjustable |
| Electronic magnification | Approx. 200 ×, 400 ×, 800 ×, 2000 × four-level adjustable (expandable to 400-4000 ×) |
GAOPIN microscopes are used by leading enterprises, research institutes, and universities. Our collaborative relationships include:
Jiangsu Bigao Electromechanical Equipment Co., Ltd. – Dimensional & micro-flaw detection for precision-machined parts
Research Institute of Physical and Chemical Engineering of Nuclear Industry – Micro-morphology-observation & precision-component-analysis of special-materials
DOOV – Mobile-device-assembly-inspection, screen & component-appearance-testing
Shanghai Institute of Optics and Fine Mechanics, CAS – Advanced-optical-research & optical-component-characterization
Tsinghua University – Teaching, laboratory-imaging and experimental-data-archiving
Beijing Institute of Technology – Scientific-research-analysis for military-grade-materials and optoelectronic-devices
Objective & Eyepiece: Wipe lenses gently with lens paper and lens cleaner. Never touch optical lenses with bare hands or use ordinary paper towels for cleaning.
Main Body & Stage: Clear sample debris and metallurgical-powder promptly. Wipe the housing with a dry soft cloth; avoid liquid splashes. Regularly check that stage screws are tight to prevent shifting caused by collisions.
Transmitted & Reflected Light Source: Turn off the light source when the microscope is idle. Blow dust off the light window and do not touch the bulb directly.
Mechanical Focus Mechanism: Do not twist the focus handwheel with excessive force. Keep sliding tracks clean; never lubricate them by yourself.
Storage Environment: Store in a dry, well-ventilated space to resist moisture and mold. Cover the device with a dust cover after use.
A1: It offers 50-500 × visual magnification and 200-2000 × electronic magnification. Eyepiece and monitor synchronous-observation is available for routine and precision-inspection.
A2: It supports HDMI video-output and Gigabit-LAN port-connection. It can work independently with a monitor or connect to a PC via LAN for image-transmission and software-control.
A3: It supports 4K shooting, video-recording and high-precision-measurement. The matched software realizes depth-of-field stacking and image-stitching. It supports USB-flash-drive and PC-storage, report-export and secondary-development.
A4: Blurry images are caused by uneven samples, high-magnification, dusty lenses or improper-focus. Flatten samples, reduce magnification, clean the lens and adjust focus for clear-imaging.
A5: No HDMI image: Check power-supply, cable-connection and monitor-signal-source, then restart the device. LAN-connection- failure: Keep PC and device in the same network-segment, turn off firewall and verify IP-settings.
A6: Ideal for metallographic-analysis, chips, precision-electronics, powder-metallurgy and fiber-testing. Suitable for industrial-quality-inspection, scientific-research and teaching.
Kunshan Gaopin Precision Instrument Co., Ltd., founded in 2011 whose founder has accumulated industry expertise since 2005, is a tech-focused enterprise specializing in the design, R&D, sales and after-sales service of industrial microscopes. Our core engineering team brings over ten years of specialized experience, ensuring mature technology and reliable quality. With more than one hundred optical-product models and a global customer base, GAOPIN continuously delivers tailor-made, cost-effective microscopy solutions. We provide fast-response global technical support through online conferences, video-assisted guidance, and remote training sessions. Our manufacturing base is located in Kunshan, Jiangsu Province (close to Shanghai). Both on-site factory inspections and virtual plant tours are available for clients. Feel free to get in touch with us for sample test images captured by this GP-L200-324K 4K High magnification metallographic microscope with 4K Ultra HD to evaluate imaging performance firsthand.
Address
Building 2, Shuanglian International Business Center, Huaqiao Town, Kunshan City, China
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