Research grade metallographic microscope with 4K Ultra HD & Autofocus Large-Stage 4K Metallurgical Microscope. 4K Autofocus Research-Grade Metallurgical Microscope adopts 5-step magnification adjustment, with magnification ranging from 380× to 6080×. The extra-large moving stage can hold large-size samples. 4K ultra-clear images deliver sharp and delicate microstructure details. The trinocular port can be connected to cameras and metallographic analysis software, well-suited for large-metal observation, semiconductor inspection, PCB slice analysis, scientific research and quality control.
This instrument is suitable for microscopic observation of metallographic microstructures and surface morphology. It serves as an ideal research tool for metallurgy, mineralogy and precision-engineering disciplines.
4K camera built-into trinocular housing for simultaneous viewing via eyepieces and external monitor. Multi-port output via HDMI, USB3.0 and WIFI transmits ultra-HD micro-images in real-time.
Optical magnification 50-800×; max pure-digital magnification reaches 6080X with five-objective-lens set. Precision optical-path delivers sharp details for chip and wafer micro-inspection.
Built-in hardware auto-focus module enables smooth, vibration-free focusing and boosts efficiency for mass-sample testing; manual-focus mode is also available.
Extra-large moving specimen-stage paired with thick integrated metal base. Remains stable for large-size samples without wobble during long-time-observation.
Minimalist integrated lab-style rigid metal frame, perfectly suited for semiconductor workshops, university laboratories and QC facilities.
Ideal for chip-and-wafer inspection; also widely applied for semiconductor testing, metallographic analysis, material-research and quality-evaluation work.
Supports 4K photo & video recording, dual-measurement modes (on-screen built-in + PC-software). Dual-storage via U-disk & computer. Depth-of-field synthesis works both on-monitor and PC-software; image-stitching function is available only in PC-software. Secondary-development is supported for image archiving, comparison and advanced analysis.
Specimen Stage: GP-L500-462H adopts large-size moving stage for large-format chips / wafers with wide travel range. Ordinary metallurgical microscopes are equipped with small-size stage only for small samples and require frequent specimen re-positioning.
Magnification Range: 380-6080X five-speed high-magnification, delivering sharp details for tiny chip-circuit inspection. Ordinary metallurgical microscopes have fewer magnification-gears and lower maximum magnification, resulting in blurry images under high power.
Imaging & Measurement: Native 4K research-grade camera, built-in on-monitor measurement, photo-video storage function. Ordinary metallurgical microscopes adopt low-definition 2K camera without onboard measurement, PC-software is mandatory for analysis work.
Application Scope: Optimized for wafers, semiconductors and large-precision-electronic-parts inspection. Ordinary metallurgical microscopes are only suitable for small metal slices and perform poorly for large chip-specimens.
Mechanics: Full-metal construction for high rigidity and vibration resistance. Hardware auto-focus module equipped. Precision coarse-fine focusing without backlash. Large-size manual XY stage with low wear and minimal clearance. Trinocular optical path maintains optical co-alignment when switching objectives.
Optics: Infinity-corrected plan-achromatic metallurgical objectives with anti-fog hard coating. Reflected-light 6V-30W halogen-lamp illumination.
Imaging and Measurement: 8.3-megapixel 4K industrial-grade CMOS camera. Multi-output interfaces: HDMI + USB3.0 + WIFI, featuring excellent anti-interference performance for industrial-environment applications. Supports both embedded on-screen measurement and PC-software-based measurement. Dual-path storage: USB flash drive and PC software. Depth-of-field stacking function is available on-screen and via PC software; the image-stitching function is supported by PC-software only. Secondary-development interface is accessible via USB3.0 / WIFI.
Operating Environment: Working temperature 10-35℃, relative humidity 30-75%RH. Stable under regular factory electromagnetic-environment. Avoid heavy vibration, corrosive gas and heavy dust. Keep WIFI module away from strong signal-interference sources.
Quality & Maintenance: Full-item factory inspection. Do not disassemble optical modules or auto-focus module. Regular dust-proof cleaning will extend service life.
Semiconductor Wafers & Chips (Core Application):
Silicon wafers, lithography slices, IC chips, MOS tubes, PCBs, FPC flexible circuits, packaged solder joints.
Inspection targets: internal micro-chip circuits, wafer coatings, etching defects, packaging bubbles, cold-soldering
joints, oxidation and pin deformation.
Metallographic Specimens & Metal Cutting Components:
Metallographic sections, alloy steel, precision-stamped metal parts.
Inspection targets: metal grain structure, heat-treatment metallographic analysis, micro surface cracks,
cutting-edge chipping, burrs, wear traces and internal material impurities.
Laboratory Samples: Powder, Fiber & Thin-Film:
Metal powder, chemical powder, carbon fiber, textile fiber, optical-coating films.
Observe particle morphology, fiber texture, film delamination and micro-coating structures.
Optoelectronic & Precision Plastic Components:
LED chips, optical lenses, injection-molded parts, semiconductor-packaging glue.
Detect micro-pores, surface stains, rough edges, delamination, bubbles and tiny cosmetic flaws.
Large-Size Precision Miniature Components:
Connectors, terminals, micro-springs, large-stamped workpieces, long-dimension parts.
Extra-large moving stage accommodates oversized samples; 4K-pixel-level accurate measurement for gaps, hole
diameters, height differences and linear dimensions.
Academic Labs & Semiconductor Factory QC:
Material-research experiments, incoming-goods and finished-goods full-inspection for semiconductors,
metallographic-specimen observation; photo/video archiving, connect to PC to export professional measurement QC
reports.
This unit features native 3840*2160 4K imaging. It is suitable for precise inspection of semiconductors, PCBs and material slices as well as test-report export, clearly revealing tiny textures and micro-defects.
Hardware auto-focus equipped. Fits mass-production-inspection and frequent sample-replacement. Achieves fast focusing after sample movement without repeated manual adjustment.
Large moving stage and vertical trinocular metallurgical optical-path are designed for large-size wafers, full-size PCBs and metal samples, effectively suppressing reflective glare.
Dual-magnification-range: 50-800X optical magnification, 380-6080X digital magnification. Covers both overall-specimen observation and micro-grain / micro-defect inspection.
Supports built-in on-device measurement and PC-software measurement. Equipped with HDMI, USB3.0 and WIFI output ports. Photos, videos and measurement-data can be saved via U-disk or computer. Secondary-development supported for production-line integration and lab-data-traceability.
Neutral-packing shipment is available upon request.
| Item | Description |
| Product | GP-L500-462H Research grade metallographic microscope with 4K Ultra HD & Autofocus |
| Category | Industrial Research-Grade Large-Platform 4K Autofocus Metallurgical Inspection & Measuring Microscope |
| Core Technologies | Trinocular synchronous-viewing optical system, large-area moving specimen-stage, high-power metallurgical objective-lens set, 4K ultra-HD CMOS imaging sensor, hardware auto-focus module, triple-channel transmission (HDMI+USB3.0+WIFI), dual-measurement system, depth-of-field synthesis & image-stitching algorithm, open-architecture supporting secondary-development |
| Key Specifications | Visual magnification: 50/100/200/500/800×; Electronic magnification: 380/760/1520/3800/6080× (6080X is pure digital zoom); Triple-output ports: HDMI + USB3.0 + WIFI; 4K capture resolution: 3840×2160; Hardware auto-focus equipped; Dual-measurement modes: built-in precise measurement + dedicated PC-software measurement; Dual-storage modes: U-disk local storage + PC-software storage; Monitor terminal supports dimensional measurement, HD image preview, photo-video recording, depth-of-field synthesis; PC terminal supports dimensional measurement, file storage, depth-of-field synthesis and image-stitching; Whole-unit supports secondary-development integration. |
| Typical Applications | Semiconductor-wafer-and-chip-microstructure inspection, large-size-electronic-component observation, metal metallographic-grain-structure analysis, packaging-circuit detection, PCB cross-section inspection, precision-electronic-component-failure analysis, new-energy-material quality-testing, university-advanced-material-laboratory research |
| Manufacturer | Kunshan Gaopin Precision Instrument Co., Ltd. |
| Manufacturer Location | Kunshan, Jiangsu, China (adjacent to Shanghai) |
| Model | GP-L500-462H |
| Resolution | 3840×2160 |
| Real Effective Pixels | 8.3 Megapixels |
| Focusing Method | auto-focus |
| Optical Format | 1/1.8" |
| Pixel Size | 2.0 μm × 2.0 μm |
| Output Method | HDMI + USB3.0 + WIFI |
| Detailed functional introductions corresponding to each output interface |
① HDMI connects to 4K-compatible displays. Embedded professional image-processing firmware supports
hardware-driven auto-focus, photo-recording, video-recording, dimensional measurement, image playback
and
image comparison, operated by mouse in real-time. ② USB 3.0 connects to computer, bundled with high-quality professional image-processing software for photo capture, dimensional measurement, depth-of-field fusion and image-stitching. ③ WIFI module connects to laptops or mobile devices; real-time image transmission, photography and storage via matching software. |
| Frame Rate |
HDMI: 60fps @3840×2160 USB3.0: 30fps @3840×2160; 60fps @1920×1080 WIFI: 30fps @3840×2160; 60fps @1920×1080 |
| Depth-of-Field Synthesis | Supported by both HDMI on-monitor firmware and PC-software |
| Image Stitching | Supported only on PC-software side |
| Measurement Method | Built-in on-monitor measurement system + PC-software measurement |
| Measurement Accuracy | 0.002-0.005 mm |
| Measurement Units | mm / μm / mil / inch (4 switchable units) |
| Measurement Tools | Length, angle, radian, circle, polygon, polyline, center-to-center distance, rectangle, annotation adding, automatic edge detection, scale bar and more |
| Storage Method | U-disk storage + PC-software storage |
| Display Language | Simplified Chinese / English (switchable) |
| Processor | ARM Cortex-A17 Quad-Core @ Max 1.4 GHz main-control processor |
| Operating System | Independently-developed measurement firmware based on Linux 3.1 kernel |
| Image Naming | Automatic or manual naming available |
| Viewing Head | 30°-inclined hinge-type trinocular head; inter-pupillary adjustment range: 53 mm-75 mm |
| Observation Modes | Bright-field / oblique illumination / simple polarization |
| Illumination System | Reflected-only falling-light illumination system, 100-240V wide-voltage input, adjustable filament center, continuously-adjustable light intensity. |
| Stand |
① Shooting-type rack, low-hand-position coaxial coarse-fine focusing mechanism, with locking and
limiting
devices; fine-movement graduation value: 0.7 μm. Halogen-lamp reflected-light illumination. ② Bright-field reflector with variable aperture stop, field stop and color-filter switching unit. ③ Yellow, blue, green filters and frosted-glass sheet supplied for reflected-light optical path. |
| Mechanical Stage | ★Mechanical moving stage. Stage dimension: 280 mm × 270 mm; X-Y travel: 204 mm × 204 mm (8-inch travel). Glass specimen-carrier plate for reflected-light observation only, suitable for large-dimension workpieces. |
| Light Source | 6V 30W halogen-lamp chamber (reflected light only) |
| Simple polarization | Pull-push polarizer and polarizer |
| Electronic Interface | CTV 1X fixed-focus camera interface; CTV 0.5X is optional with price difference compensation. |
| Eyepieces | Two WF10X/22 mm wide-angle plan-field eyepieces with individual diopter adjustment |
| Nosepiece | ★Mingchang five-hole objective nosepiece |
| Metallurgical Objectives |
★Infinity-corrected plan-achromatic metallurgical objectives ① PL L5X/0.12, Working Distance: 26.1 mm ×1pc ② PL L10X/0.25, Working Distance: 20.2 mm ×1pc ③ PL L20X/0.40, Working Distance: 8.80 mm ×1pc ④ PL L50X/0.70, Working Distance: 3.68 mm ×1pc ⑤ PL L80X/0.80, Working Distance: 1.25 mm ×1pc |
| Optical Magnification | 50X, 100X, 200X, 500X, 800X (five-level switchable) |
| Electronic Magnification | Approx. 380X, 760X, 1520X, 3800X, 6080X (five-level switchable); optional range: 190-3040X. |
GAOPIN microscopes are used by leading enterprises, research institutes, and universities. Our collaborative relationships include:
Shanghai Institute of Ceramics, CAS – Micro-analysis of inorganic ceramics & new-energy materials
Research Institute of Physical and Chemical Engineering of Nuclear Industry – Micro-morphology observation & precision-component analysis for special-materials
Shanghai Institute of Optics and Fine Mechanics, CAS – Advanced-optical-research & optical-component characterization
Tsinghua University – Teaching, laboratory-imaging, and experimental-data-archiving
Beijing Institute of Technology – Scientific-research-analysis for military-materials & optoelectronic-devices
DOOV – Mobile-device-assembly-inspection, screen & component-appearance-testing
A1: Equipped with HDMI, USB3.0 and WIFI interfaces. It supports direct-monitor display and wired / wireless PC connection.
A2: It supports 4K ultra-HD photo and video recording. Files can be saved to FAT32-formatted U-disk within 32 GB capacity or computer storage. Supports both on-screen and PC-software precision measurement, with data-saving and report-export functions.
A3: It supports hardware auto-focus, depth-of-field synthesis, PC-side image-stitching and secondary-development. Widely applied for metallographic-analysis, semiconductor-inspection, precision-component-inspection, scientific-research, teaching and high-end-industrial precision-detection.
A4: No-image troubleshooting: Check power-supply, HDMI cable and monitor signal source, then restart the device. Blurry-image troubleshooting: Adjust manual-focus handwheel, lay sample flat and clean lens surface. Network-failure troubleshooting: Set PC and device within same IP-segment, turn-off firewall and reconnect network-cable. U-disk-error troubleshooting: Replace or re-format U-disk (must be FAT32 and ≤32 GB).
Kunshan Gaopin Precision Instrument Co., Ltd. was officially incorporated in 2011. Our founding-members accumulated hands-on optical-instrument know-how starting in 2005. We deliver full-cycle-support covering custom-optical-design, in-house-R&D, international-sales and comprehensive-after-sales-maintenance-services. Our skilled-engineering-team possesses more than ten-years of microscopy-development-expertise, ensuring stable-technical-performance and consistent-product-reliability.
GAOPIN supplies more than 100 categories of optical-testing-instruments, serving industrial-and-laboratory-clients around the globe. We focus on delivering flexible, cost-effective tailor-made microscopy-inspection-solutions to satisfy diverse-testing-requirements.
For overseas-buyers, we provide responsive worldwide-technical-support including remote-online-consultations, practical-video-tutorials and live-remote-equipment-operation-training. Our production-facility locates in Kunshan, Jiangsu Province, with convenient-transport-access to Shanghai. On-site-factory-visits and virtual-online-tours are welcomed. Please contact our sales-team for authentic-sample-testing-photos captured by this Research grade metallographic microscope with 4K Ultra HD & Autofocus to evaluate real-imaging-performance.
Address
Building 2, Shuanglian International Business Center, Huaqiao Town, Kunshan City, China
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