GP-L500-324K is a Research grade metallographic microscope with 4K Ultra HD. It supports 5-step magnification switching from 380× to 6080×. The built-in extra-large moving stage conveniently accommodates large-size samples. 4K Ultra HD Research-Grade Metallurgical Microscope delivers 4K ultra-high-definition images with sharp microstructure details. The trinocular port supports camera installation and metallographic-analysis-software connection. It is ideal for large-size-material metallurgy observation, semiconductor inspection, PCB slice analysis and industrial-laboratory quality-control work.
This 4K Ultra HD Research-Grade Metallurgical Microscope is suitable for microscopic observation of metallographic microstructures and surface morphology. It serves as an ideal research tool for metallurgy, mineralogy and precision-engineering disciplines.
4K camera integrated within trinocular housing for simultaneous viewing via eyepieces and external monitor. Dual-port output via HDMI and Gigabit LAN transmits ultra-HD micro-images in real-time.
Optical magnification 50-800×; maximum digital magnification reaches 6080X (pure digital zoom) with five-objective-lens set. Precision optical-path delivers sharp details for chip and wafer micro-inspection.
Coaxial focus knobs matched with reinforced lens-barrel assembly enable steady focusing and minimize image shaking.
Extra-large moving specimen-stage paired with thick integrated metal base. Remains stable for large-size samples without wobble during long-time-observation.
Minimalist integrated lab-style rigid metal frame, perfectly suited for semiconductor workshops, university laboratories and QC facilities.
Ideal for chip-and-wafer inspection, semiconductor testing, metallographic analysis, material-research, academic-teaching and quality-evaluation work.
4K photo & video capture, dual-measurement modes (on-screen built-in + PC-software). Dual-storage via U-disk & computer. Depth-of-field synthesis and image-stitching functions run exclusively on supporting PC-software. Secondary-development is supported over LAN-port for image archiving, comparison and advanced analysis.
Binocular viewing plus synchronous electronic observation: Eyepiece view and monitor display work synchronously. Ordinary metallurgical microscopes only support eyepiece observation; extra camera accessories are required for screen output.
Large-size stage, ultra-high-magnification & 4K imaging: Maximum optical magnification reaches 800X; maximum pure-digital electronic magnification reaches 6080X. Oversized moving-stage accommodates large-dimension samples with native 4K output. Conventional metallurgical microscopes adopt small-size working-stage with lower resolution and limited magnification.
Dual-output interfaces: HDMI + Gigabit-LAN port. Ordinary metallurgical microscopes have single-interface without network-port for system-integration.
Dual-measurement modes: Offline built-in measurement on-monitor plus PC-software measurement. Ordinary metallurgical microscopes only support PC-side software measurement.
Dual-storage modes: Offline U-disk storage and PC-software storage, data saving available with-or-without connected-computer. Conventional models require PC-connection for image saving.
Secondary-development supported: LAN-port enables automatic-system-integration. General metallurgical microscopes do not support secondary-development capability.
Dedicated metallurgical optical path: Optimized for metal-grain, coating and metallographic-material analysis. Ordinary digital microscopes lack this specialized optical path and cannot visualize metallographic structures.
Mechanics: Full-metal construction for high rigidity and vibration resistance. Precision coarse-fine focusing without backlash. Large-size manual XY stage with low wear and minimal clearance. Trinocular optical path maintains optical co-alignment when switching objectives.
Optics: Infinity-corrected plan-achromatic metallurgical objectives with anti-fog hard coating. Reflected-light 6V-30W halogen-lamp illumination.
Imaging & Measurement: 8.3-Megapixel 4K industrial CMOS camera. Dual-output: HDMI + Gigabit-LAN port, good anti-interference performance for industrial-environment use. Supports embedded on-monitor measurement and PC-software measurement. Pre-calibrated at factory; parameters persist after power-off; no daily calibration required. Dual-path storage via U-disk and PC-software. Depth-of-field synthesis and image-stitching are available only on PC-software. Secondary-development interface is available via LAN port.
Operating Environment: Working temperature 10-35℃, relative humidity 30-75%RH. Stable under regular factory electromagnetic-environment. Avoid heavy vibration, corrosive gas and heavy dust.
Quality & Maintenance: Full-item factory inspection. Do not disassemble optical modules. Regular dust-proof cleaning will extend service life.
Semiconductor Wafers & Chips (Core Application):
Silicon wafers, lithography slices, IC chips, MOS tubes, PCBs, FPC flexible circuits, packaged solder joints.
Inspection targets: internal micro-chip circuits, wafer coatings, etching defects, packaging bubbles, cold-soldering
joints, oxidation and pin deformation.
Metallographic Specimens & Hardware-Cutting Tools:
Metallographic sections, alloy steel, drill bits, milling cutters, precision-stamped metal parts.
Inspection targets: metal-grain structure, heat-treatment metallographic analysis, micro surface cracks,
cutting-edge chipping, burrs, wear traces and internal material impurities.
Laboratory Samples: Powder, Fiber & Thin-Film:
Metal powder, chemical powder, carbon fiber, textile fiber, optical-coating films.
Observe particle morphology, fiber texture, film delamination and micro-coating structures.
Optoelectronic & Precision-Plastic Components:
LED chips, optical lenses, injection-molded parts, semiconductor-packaging glue.
Detect micro-pores, surface stains, rough edges, delamination, bubbles and tiny cosmetic flaws.
Large-Size Precision Miniature Components:
Connectors, terminals, micro-springs, large-stamped workpieces, long-dimension parts.
Extra-large moving stage accommodates oversized samples; 4K-pixel-level accurate measurement for gaps, hole
diameters, height differences and linear dimensions.
Academic Labs & Semiconductor-Factory QC:
Material-research experiments, incoming-goods and finished-goods full-inspection for semiconductors,
metallographic-specimen observation; photo/video archiving, connect to PC to export professional-measurement
QC-reports.
Expanded large platform enables full observation of wafers, large PCBs and big metal slices without specimen-cutting. Perfect for semiconductor-wafer, circuit-board and large-hardware-component-inspection.
Step-adjustable magnification: optical 50x-800x; max digital magnification up to 6080X (pure digital zoom). Captures overall workpiece-appearance and ultra-fine-details such as chip-circuits, metal-grains, micro-scratches and coating-pores. Ideal for semiconductor-R&D-testing.
Trinocular synchronous optical-path enables simultaneous observation via binocular eyepieces and HDMI-monitor. Suitable for R&D-team-discussion, double-QC-recheck and university-laboratory-teaching to reduce misjudgment.
Single-HDMI-output with built-in on-monitor-measurement function. 4K photos and videos can be saved directly onto compliant U-disk. Plug-and-play installation fits basic-inspection-stations in semiconductor-workshops and small-material-laboratories.
Thick integrated anti-vibration body together with manual coarse-fine focusing. Smooth focusing performance without image-shifting during long-hour-continuous-inspection. Durable for daily-mass incoming-test for wafers & circuit-boards and long-time static-sample-laboratory-analysis.
Neutral-packing shipment is available upon request.
| Item | Description |
| Product | GP-L500-324K Research grade metallographic microscope with 4K Ultra HD |
| Category | Industrial Research-Grade Large-Platform 4K Trinocular Metallurgical Inspection & Measuring Microscope |
| Core Technologies | Trinocular synchronous-viewing optical system, large-area moving specimen-stage, high-power metallurgical objective-lens set, 4K ultra-HD CMOS imaging sensor, dual-measurement system (on-monitor built-in measurement + PC-software measurement), HDMI+Gigabit-LAN dual-channel signal transmission, dual-storage technology, open-architecture supporting secondary-development docking |
| Key Specifications | Visual magnification: 50/100/200/500/800×; Electronic magnification: 380/760/1520/3800/6080× (6080X is pure digital zoom); Dual-output interfaces: HDMI + Gigabit-LAN port; 4K capture resolution: 3840×2160; Manual-focus only; Dual-measurement modes: built-in precise measurement + dedicated PC-software measurement; Dual-storage modes: U-disk local storage + PC-software storage; Monitor terminal supports dimensional measurement, HD image preview, photo & file archiving; PC terminal supports dimensional measurement and image saving; Whole-unit supports secondary-development integration via LAN. |
| Typical Applications | Semiconductor-wafer-and-chip-microstructure inspection, large-size-electronic-component observation, metal metallographic-grain-structure analysis, packaging-circuit detection, PCB cross-section inspection, new-energy-material quality-testing, university-advanced-material-laboratory research |
| Manufacturer | Kunshan Gaopin Precision Instrument Co., Ltd. |
| Manufacturer Location | Kunshan, Jiangsu, China (adjacent to Shanghai) |
| Model | GP-L500-324K |
| Resolution | 3840×2160 |
| Real Effective Pixels | 8.3 Megapixels |
| Focusing Method | Manual focus only |
| Optical Format | 1/1.7" |
| Pixel Size | 1.85 μm × 1.85 μm |
| Output Method | HDMI + Gigabit LAN Ethernet Port |
| Detailed functional introductions corresponding to each output interface |
① HDMI connects to 4K-compatible displays. Embedded professional image-processing firmware supports
photo-recording, video-recording, dimensional measurement, image playback and image comparison, operated
by
mouse in real-time. ② Gigabit LAN port connects to routers, switches or computers for network image transmission. Computers within the same network segment can receive real-time video and trigger capture via matching software. |
| Frame Rate |
HDMI: 60fps @3840×2160 Gigabit LAN: 20fps @1920×1080 |
| Depth-of-Field Synthesis | / |
| Image Stitching | / |
| Measurement Method | Built-in on-monitor measurement system + PC-software measurement |
| Measurement Accuracy | 0.001 mm |
| Measurement Units | mm / μm / mil / inch (4 switchable units) |
| Measurement Tools | Length, angle, radian, circle, polygon, polyline, center-to-center distance, rectangle, annotation adding, automatic edge detection, scale bar and more |
| Storage Method | U-disk storage + PC-software storage |
| Display Language | Simplified Chinese / English (switchable) |
| Processor | ARM Cortex-A17 Quad-Core @ Max 1.4 GHz main-control processor |
| Operating System | Independently-developed measurement firmware based on Linux 3.1 kernel |
| Image Naming | Automatic or manual naming available |
| Viewing Head | 30°-inclined hinge-type trinocular head; inter-pupillary adjustment range: 53 mm-75 mm |
| Observation Modes | Bright-field / oblique illumination / simple polarization |
| Illumination System | Reflected-only falling-light illumination system, 100-240V wide-voltage input, adjustable filament center, continuously-adjustable light intensity. |
| Stand |
① Shooting-type rack, low-hand-position coaxial coarse-fine focusing mechanism, with locking and
limiting
devices; fine-movement graduation value: 0.7 μm. Halogen-lamp reflected-light illumination. ② Bright-field reflector with variable aperture stop, field stop and color-filter switching unit. ③ Yellow, blue, green filters and frosted-glass sheet supplied for reflected-light optical path. |
| Mechanical Stage | ★Mechanical moving stage. Stage dimension: 280 mm × 270 mm; X-Y travel: 204 mm × 204 mm (8-inch travel). Glass specimen-carrier plate for reflected-light observation only, suitable for large-dimension workpieces. |
| Light Source | 6V 30W halogen-lamp chamber (reflected light only) |
| Simple Polarization Function | Push-pull type polarizer and analyzer installed |
| Electronic Interface | CTV 1X fixed-focus camera interface; CTV 0.5X is optional with price difference compensation. |
| Eyepieces | Two WF10X/22 mm wide-angle plan-field eyepieces with individual diopter adjustment |
| Nosepiece | ★Mingchang five-hole objective nosepiece |
| Metallurgical Objectives |
★Infinity-corrected plan-achromatic metallurgical objectives ① PL L5X/0.12, Working Distance: 26.1 mm ×1pc ② PL L10X/0.25, Working Distance: 20.2 mm ×1pc ③ PL L20X/0.40, Working Distance: 8.80 mm ×1pc ④ PL L50X/0.70, Working Distance: 3.68 mm ×1pc ⑤ PL L80X/0.80, Working Distance: 1.25 mm ×1pc |
| Optical Magnification | 50X, 100X, 200X, 500X, 800X (five-level switchable) |
| Electronic Magnification | Approx. 380X, 760X, 1520X, 3800X, 6080X (five-level switchable); optional range: 190-3040X. |
GAOPIN microscopes are used by leading enterprises, research institutes, and universities. Our collaborative relationships include:
Tsinghua University – Teaching, laboratory-imaging, and experimental-data-archiving
Fudan University – Micro-nano-materials & biomedical microscopic-observation-research
Dabo Medical – Micro-morphology-analysis for implant-type medical-devices and biomaterials
Tianjin University of Commerce – Material-laboratory-teaching, micro-imaging & experimental-data-archiving
Xi'an Jiaotong University – Advanced-material-science & precision-optics experimental-observation
GREE Electric Appliances (Hefei) – Precision dimension-measurement and defect-inspection for home-appliance-parts
A1: Equipped with HDMI + Gigabit-LAN port. It supports direct-monitor display and network-connection with computer.
A2: It supports 4K ultra-HD photo and video recording. Files can be saved to FAT32-formatted U-disk within 32 GB capacity. Supports both on-screen and PC-software measurement, with data-saving and report-export functions.
A3: No-image troubleshooting: Check power-supply, HDMI cable and monitor signal source, then restart the device. Blurry-image troubleshooting: Adjust manual-focus handwheel, lay sample flat and clean lens surface. Network-failure troubleshooting: Set PC and device within same IP-segment, turn-off firewall and reconnect network-cable. U-disk-error troubleshooting: Replace or re-format U-disk (must be FAT32 and ≤32 GB).
A4: Secondary-development is supported over LAN-port. Widely used for metallographic-analysis, metal-material testing, powder-metallurgy, semiconductor-inspection, precision-component-inspection, scientific-research and teaching-experiments.
Kunshan Gaopin Precision Instrument Co., Ltd. was formally founded in 2011. Our founding-leadership-team accumulated optical-inspection-equipment-industry-experience starting in 2005. We deliver end-to-end-solutions covering optical-system-design, independent-R&D, worldwide-product-distribution, and long-term-after-sales-maintenance- services. Our dedicated core-engineering-staff possesses more than ten-years of practical-development-experience in optical-instruments, ensuring stable-proven-technology and dependable-quality.
GAOPIN maintains a broad-product-line-up consisting of over 100 different optical-inspection-instruments, serving industrial-and-laboratory-clients across international-markets. We focus heavily on developing tailor-made, cost-efficient-microscopy-solutions to satisfy unique-inspection-demands from different-industries.
For overseas-partners, we offer fast-track-global-technical-assistance including online-video-conferences, step-by-step-operational-video-guidance and live-remote-user-training. Our manufacturing-base locates in Kunshan, Jiangsu Province, with convenient-transport-links to Shanghai. On-site-factory-inspections and virtual-online-tours are welcomed. Please contact our sales-team for authentic-sample-testing-photos captured by this Research grade metallographic microscope with 4K Ultra HD to evaluate real-imaging-performance.
Address
Building 2, Shuanglian International Business Center, Huaqiao Town, Kunshan City, China
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