Gaopin GP-307-4K 4K Measuring Microscope. This 4K Ultra High-Magnification Digital Microscope features parfocal zoom from 95X to 614X, the highest magnification model in this series. It is equipped with a 4K camera and premium monocular zoom lens. Heavy base structure effectively suppresses vibration. Built-in measurement system supports measurement of micro features, photo and video storage. Designed for high-magnification observation and dimension inspection of ultra-small workpieces.

Difference from ordinary microscopes: Standard digital microscopes can hardly reach stable magnification around 600X and suffer from vibration and defocus at high power. This High-Magnification Electron Microscope achieves 95–614X parfocal zoom without repeated focusing. Optimized optical lens maintains sharpness at high magnification. Heavy base reduces vibration. It is specially built for micron-scale sample inspection and outperforms ordinary digital microscopes.
| Model | GP-307-4K | |||
| Optical Magnification | 95X-614X | |||
| Resolution | 3840×2160 4K | |||
| Measurement Accuracy | 0.001–0.002mm | |||
| Output | HDMI for 4K display measurement + USB 3.0 for PC measurement + LAN port for PC measurement | |||
| Measurement Method | Live image measurement | |||
| Measurement Units | mm, μm, mil, inch (4 switchable units) | |||
| Storage | External USB drive + PC software storage | |||
| Illumination | LED ring light | |||
| Display Language | Simplified Chinese / English (switchable) | |||
| Operation | Mouse-operated menus | |||
| Measurement Tools | Scale and various tools: length, angle, arc, circle, polygon, polyline, center distance, rectangle, add notes, auto edge detection. | |||
| Operating System | Linux 3.1-based, self-developed measurement system | |||
| Image Naming | Automatic or manual | |||
| Crosshair | 100 horizontal and 100 vertical lines | |||
| Interface | 1× USB 3.0, 1× USB 2.0, 1× Gigabit Ethernet | |||
| Processor |
ARM Cortex-A17 quad-core @ max 1.4GHz (main processor) ARM Cortex-A7 single-core @ max 900MHz (video processor) |
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| Objective | GP-307-4K | |||
| Lens Magnification | Electronic Magnification | Field of View | Working Distance | |
| 0.7× | 94X | 5.4*3mm | 25mm | |
| 1× | 136X | 3.7*2.1mm | ||
| 1.5× | 205X | 2.4*1.3mm | ||
| 2× | 273X | 1.8*1mm | ||
| 2.5× | 341X | 1.4*0.8mm | ||
| 3× | 409X | 1.2*0.7mm | ||
| 3.5× | 478X | 1*0.6mm | ||
| 4× | 546X | 0.9*0.5mm | ||
| 4.5× | 614X | 0.8*0.4mm | ||
Application Scope: Used for micro defect inspection and micron-level dimension measurement of microchips, cutting tool edges, fiber end faces and miniature electronic parts. It observes micro scratches, chipping and line width. Suitable for semiconductor, optical component and precision cutting tool industries.
3840×2160 resolution, distortion-free during long operation, captures micro defects for QC evidence.
95–614× parfocal zoom. No frequent refocusing when changing magnification, no image drift for precision inspection.
Adjustable LED ring light provides even illumination for clear observation of solder joints and scratches.
HDMI+USB3.0+LAN, dynamic image measurement, multi-unit conversion, traceable records.
Thick metal base reduces workshop vibration interference, avoids defocus under high magnification.
| Item | Description |
| Product Model | GP-307-4K 4K Ultra HD High-Magnification Electron Microscope with Dual Light Source |
| Product Category | Industrial 4K high-magnification digital measuring microscope |
| Core Technology |
4K HD CMOS imaging; Self-developed Linux image-measurement system; Multi-function digital measurement engine; High-speed dual ARM processor architecture; Adjustable LED ring light; Gigabit Ethernet real-time synchronous transmission. |
| Key Specifications |
4K resolution 3840×2160; Optical magnification 0.7–4.5× continuously adjustable with positioning; total magnification 95-614×; Measurement accuracy 0.001–0.002 mm; mm / μm / mil / inch switchable; Three outputs: HDMI, USB 3.0, Gigabit Ethernet; External USB drive + PC / network-software dual storage; Image measurement, 4K ultra-HD photo/video capture, on-screen image comparison, USB-drive storage. |
| Typical Applications |
PCB defect inspection, chip inspection, BGA micro-solder joint inspection; Precision hardware dimension QC; metal hole / hairline micro-dimension measurement; Glass scratch inspection, electronic component inspection; Mold dimension measurement, laboratory precision dimension analysis; New-energy component inspection, crystal inspection. |
| Manufacturer | Kunshan Gaopin Precision Instruments Co., Ltd. |
| Address | Kunshan, Jiangsu Province, China (adjacent to Shanghai) |
No refocusing required during zooming, suitable for inspection of micro parts, precision pins and tiny cracks.
Direct dimension measurement on monitor. Length, angle and radius measurement available without PC for on-site QC.
Clearly captures micro burrs and surface defects on samples with uneven heights.
HDMI for real-time preview; USB enables snapshot, video recording, depth stacking, image archiving and report export.
Great vibration resistance with smooth height adjustment, delivering stable imaging during long continuous inspection.
· Optical Lens Care: Only use professional optical lens tissue or microfiber dust-free cloth to wipe lens surfaces. Never use paper towels or rough cloth to avoid scratching lens coating. For fingerprints and oil stains, apply a small amount of optical cleaner to the cloth. Do not drip liquid directly onto the lens. Avoid touching the optical surface of the lens by hand.
· Camera, Lens Barrel & Stand Maintenance: Clean the 4K camera, zoom barrel and metal column with dry dust-free soft cloth. Do not expose the whole unit to water. Keep alcohol, acetone and other strong corrosive solvents away to protect paint and printed marks. Keep all connectors dry to prevent metal oxidation and bad contact.
· Stage & Dual Light Source Care: Remove dust from the white stage and upper & lower LED dual light ring with dry soft cloth. Clean the light window in the same way as the lens, do not use corrosive liquid. Do not pull the light cable forcibly.
· Focus Mechanism Maintenance: Clean dust on focus knobs and column guide rails regularly. A small amount of dry grease can be applied. Liquid lubricants are forbidden, to prevent oil dripping and contaminating lenses, light sources and samples. Operate the focus knob gently, do not turn it forcibly to avoid gear damage.
· Power & Environment: Use the original power adapter. Place the equipment in dry, low-dust environment, away from high temperature, humidity and heavy vibration. Power off and unplug the adapter when not in use for a long time.
1. Inspection of ultra-fine PCB traces and BGA micro solder joints: Observe ultra-fine PCB tracks and BGA solder balls, detect micro cold solder, solder ball cracking, circuit gaps and solder mask pinholes. 95–614X is suitable for micro-scale fine defect inspection.
2. Inspection of semiconductor chip pins and packaging: IC chips, wafer pins and precision connector pins. Check pin corrosion, tiny chipping, excess solder and package cracks, observe micro morphology of pins.
3. Metallographic observation on crimp cross-section of precision terminals: Sliced wire harness copper terminals, check copper wire breakage, crimp voids, uneven plating thickness and micro deformation of cross-section for harness failure analysis.
4. Micro defect screening for miniature precision hardware: Micro turned parts, micro-hole components and precision contacts. Detect micro cracks, coating pinholes, fine burrs and grinding scratches on surfaces.
5. Micro morphology observation of material coatings and powders: Metal plating, film coating, powder and fiber samples. Observe particle shape and coating pores for material comparison and failure analysis.
6. Measurement of tiny precision dimensions: Cooperate with measurement software to measure fine line width, micro-hole inner diameter, tiny gaps and coating thickness, meeting high-precision measurement requirements of laboratories and quality inspection stations.
1. Workpieces for High Magnification Inspection: Samples requiring 95×–614× magnification to observe ultra-fine defects such as micro cracks, pinholes and tiny scratches.
2. Opaque Solid Workpieces: Opaque workpieces like metal, plastic, PCB and chip pins for surface appearance defect inspection.
3. Precision Dimensional Measurement Required: Products that need micron-level measurement of length, angle and arc, with data collection and quality inspection record generation.
4. Micro Precision Components: Tiny electronic components, precision molds, micro hardware and other ultra-small precision workpieces.
5. Image Archiving & Traceability Needed: Products requiring photo and video capture to save defect images for quality reports, process traceability and customer complaint evidence.
6. Customization: Supports neutral shipping
GAOPIN microscopes are used by leading enterprises, research institutes, and universities. Our collaborative relationships include:
ZHENGKUNHANG Industrial MRO Supermarket (Shanghai) Co., Ltd. – Appearance & micro-quality verification of industrial standard parts
Shanghai Institute of Optics and Fine Mechanics, CAS – Advanced optical research & optical component characterization
Huawei Electronics – Appearance and micro-defect inspection of electronic components
Dovov – Micro quality inspection for appearance and internal components of consumer electronics
A1: The microscope features continuous zoom from 95X to 614X. The focus remains stable while adjusting magnification, eliminating repeated refocusing. It saves plenty of operation time during batch sample inspection and improves production line efficiency.
A2: It adopts 4K high-definition imaging with resolution of 3840×2160. The supporting software enables precise dimensional measurement. Photo and video capture are available to store sample images and measurement data for quality archives.
A3: Equipped with a heavy black metal base and single-column lifting stand, the whole unit enjoys high stability and good vibration resistance. The focusing handwheel has balanced damping for smooth lens adjustment, ideal for long-time continuous inspection in workshops.
A4: It comes with a top ring light for surface visual inspection. Widely applied to PCB boards, hardware parts, plastic components and electronic components, to check surface scratches, damages, burrs and other cosmetic defects.
A5: It can connect to a monitor for real-time live view, photo and video capture without a PC. When connected to a computer, advanced functions including software measurement and data export are available to fit different workstation requirements.
Kunshan Gaopin Precision Instrument Co., Ltd., founded in 2011, whose founder has accumulated industry expertise since 2005, is a tech-focused enterprise specialized in the design, R&D, sales and after-sales service of industrial microscopes. Boasting a core engineering team with more than ten years of professional know-how, the company guarantees proven technologies and consistent product reliability. GAOPIN offers more than one hundred optical product models and serves customers across the globe, dedicating itself to supplying tailor-made, cost-effective microscopy solutions. We offer prompt worldwide technical support covering online conferences, video-assisted operation guidance and remote training sessions. Our manufacturing base is located in Kunshan, Jiangsu Province, in close proximity to Shanghai. Both on-site factory inspections and virtual plant tours are available for clients. Feel free to get in touch with us for sample test images shot by this 4K Ultra HD High-Magnification Electron Microscope with Dual Light Source, so you can evaluate its imaging performance directly.
Address
Building 2, Shuanglian International Business Center, Huaqiao Town, Kunshan City, China
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