GP-L700-324K is a 4K research-grade Long Working Distance Metallurgical Microscope with 4K Ultra HD, equipped with infinity-corrected plan-achromatic long-working-distance objectives. 4K Ultra HD Long Working Distance Metallurgical Microscope provides ample working-distance space and delivers flat, sharp images across the whole field-of-view with well-corrected chromatic aberration and field curvature. Built-in 4K imaging system captures fine micro-details. Trinocular port supports image-analysis-software connection. Ideal for metallographic research, semiconductor-wafer inspection and surface-defect-analysis workflows.
This 4K Ultra HD Long Working Distance Metallurgical Microscope is suitable for testing of precision components, integrated circuits and packaging-material products.
Mechanics: Full-metal construction for high rigidity and vibration resistance. Extra long working-distance for tall-height-sample-observation. Precision coarse-fine focusing without backlash. Wear-resistant manual XY mechanical stage. Trinocular optical path maintains optical co-alignment when switching objectives.
Optics: Infinity-corrected plan-achromatic metallurgical objectives with anti-fog hard coating. Reflected-light 6V-30W halogen-lamp illumination.
Imaging & Measurement: 8.3-Megapixel 4K industrial CMOS camera. Dual-output: HDMI + Gigabit-LAN port, good anti-interference performance for industrial-environment-use. Supports embedded on-monitor measurement and PC-software measurement. Pre-calibrated at factory; parameters persist after power-off; no daily-calibration-required. Dual-path storage via U-disk and PC-software. Depth-of-field synthesis and image-stitching available only on PC-software. Secondary-development-interface available over Gigabit-LAN.
Operating Environment: Working temperature 10-35℃, relative humidity 30-75%RH. Stable under regular-factory-electromagnetic-environment. Avoid heavy vibration, corrosive gas and heavy dust.
Quality & Maintenance: Full-item factory inspection. Do not disassemble optical modules. Regular dust-proof cleaning will extend service life.
1. Magnification: 380-3800X four-speed high-magnification for grain-and-chip-micro-structure observation. Ordinary metallurgical microscopes have lower maximum magnification and blurry images at high-power, and cannot observe tiny metal grains.
2. Imaging System: Native 4K research-grade camera, synchronized eyepiece-and-monitor viewing. Ordinary metallurgical microscopes adopt low-definition 2K-grade camera and only eyepiece-viewing.
3. Measurement & Storage: Built-in on-monitor precise-measurement, photo-video-capture for test-evidence-archiving. Ordinary metallurgical microscopes have no onboard-measurement and require PC-software for all measurement-and-file-saving work.
4. Application Range: Optimized for precise inspection of wafers, semiconductor chips and metal grains. Ordinary metallurgical microscopes are only suitable for simple metal-slice observation with poor performance for fine chip-grade samples.
4K camera built-into trinocular housing for simultaneous viewing via eyepiece and monitor. Dual-port output via HDMI and Gigabit-LAN transmits ultra-clear micro-graphs in real-time.
Precision multi-layer lens optical-path with four-step magnification; max digital magnification up to 3800X, delivering sharp micron-level micro-structure details for wafer, chip and grain inspection.
Coordinated focus knobs and reinforced lens-barrel assembly enable steady, vibration-free focusing, perfectly suited for fine inspection under ultra-high magnification. Manual-focus only.
Oversized thick square metal base provides stable weight-balance, eliminating shifting or shaking during long-continuous high-power observation.
Rigid black-and-white metal body with separate detachable light-source module, minimalist professional design for labs and semiconductor production-lines.
Optimized for wafer-and-chip inspection; also widely applied to metallographic-analysis, advanced-material-research, academic-teaching and precision-industrial-quality-control work.
4K photo & video capture, dual-measurement modes (on-screen built-in + PC-software). Dual-storage via U-disk & computer. Depth-of-field synthesis and image-stitching functions run exclusively on supporting PC-software. Secondary-development supported over LAN-port for image archiving, comparison and advanced-data-analysis.
Semiconductor & Microelectronics (Core Application):
Silicon wafers, lithography slices, IC chips, MOS tubes, PCBs, FPC flexible circuits, packaged solder joints.
Inspection targets: micro-chip-circuit patterns, wafer-etching-defects, coating-scratches, packaging-bubbles,
cold-soldering-joints, oxidation and pin-deformation.
Metallographic Metal Specimens & Metal-Cutting-Tools:
Alloy metallographic sections, steel slices, precision-stamped metal hardware.
Inspection targets: metal-grain-structure, heat-treatment-metallographic-analysis, micro-surface-cracks,
cutting-edge-chipping, burrs, wear-traces and internal-material-impurities.
Laboratory Research Samples: Crystal, Powder & Thin-Film:
Single-/poly-crystals, metal powder, chemical powder, optical-coating-films, ultra-thin-film-materials.
Observe micro-crystal-lattices, ultra-fine-particle-morphology, film-delamination and micro-coating-textures.
Optoelectronic Precision-Plastic Components:
LED chips, optical-glass-lenses, semiconductor-packaging-glue.
Detect micro-pores, nano-scratches, glue-delamination, bubbles and subtle-surface-unevenness.
Miniature Precision Components:
Connectors, terminals, micro-springs, small precision-stamped-workpieces.
4K-pixel-level accurate measurement for gaps, hole-diameters, pitch and surface-height-differences; observe subtle
crimp-deformation.
University Labs & High-End Semiconductor QC:
Material-research-experiments, metallurgy-teaching-analysis, incoming-and-finished-goods-wafer-sampling-inspection;
photo-video archiving, export precise-measurement QC-reports via PC.
Equipped with native 3840*2160 4K ultra-HD imaging. Suitable for wafer-metallographic-inspection and metal-material-analysis; clearly shows grain boundaries, micro-scratches and tiny micro-defects.
Manual-focus design fits laboratory-research-samples and university-material-research. Uniform stable fine-tuning supports long-term static-sample-observation.
Independent split coaxial light-source for semiconductor-wafers, metal-specimens and precise-PCB slices. Vertical coaxial lighting suppresses metal-reflective-glare and restores real metallographic-textures.
Dual-magnification-range: 50-500X optical magnification, 380-3800X digital magnification. Covers both full-specimen overview and micro-grain / micro-defect inspection.
Supports built-in on-device measurement and PC-software measurement. Equipped with HDMI and Gigabit-LAN dual-output ports. Photos, videos and measurement-data can be saved via compliant U-disk or computer. Secondary-development supported for production-line integration and lab-data-traceability.
Neutral-packing shipment is available upon request.
| Item | Description |
| Product Model | GP-L700-324K Long Working Distance Metallurgical Microscope with 4K Ultra HD |
| Product Category | High-Magnification Research-Grade Vertical Metallurgical Microscope with Split Vertical Illumination Light Source |
| Core Technologies | Trinocular synchronous-viewing optical system, split independent coaxial vertical light-source module, high-resolution metallurgical objective-lens set, 4K ultra-HD CMOS image sensor, dual-measurement system (on-device built-in precise measurement + PC-software measurement), HDMI+Gigabit-LAN dual-channel signal transmission, dual-storage solution, open-architecture supporting secondary-development docking |
| Key Specifications | Optical magnification: 50/100/200/500×; Electronic magnification: 380/760/1520/3800×; Dual-output interfaces: HDMI + Gigabit-LAN port; 4K capture resolution: 3840×2160; Focus mode: Manual focusing; Dual-measurement modes: built-in precise measurement + dedicated PC-software measurement; Dual-storage modes: U-disk local storage + PC-software storage; Monitor terminal functions: Dimensional measurement, HD image viewing, photo archiving; PC terminal functions: Dimensional measurement, photo storage; Remark: Supports secondary-development integration. |
| Typical Application Scenarios | Wafer-&-chip-grain observation, semiconductor-packaging-defect-inspection, metal-grain metallographic-structure-analysis, precision-circuit-tiny-flaw-detection, electronic-component-failure- analysis, new-material-laboratory-scientific-research |
| Manufacturer | Kunshan Gaopin Precision Instrument Co., Ltd. |
| Factory Address | Kunshan City, Jiangsu Province, China (adjacent to Shanghai) |
| Model | GP-L700-324K |
| Resolution | 3840×2160 |
| Real Effective Pixels | 8.3 Megapixels |
| Focusing Method | Manual focus |
| Optical Format | 1/1.7" |
| Pixel Size | 1.85 μm × 1.85 μm |
| Output Method | HDMI + Gigabit Ethernet LAN Port |
| Detailed functional introductions corresponding to each output interface |
① HDMI connects to 4K-compatible displays. Embedded professional image-processing firmware supports
photo-recording, video-recording, dimensional measurement, image playback and image comparison, operated
by mouse in real-time. ② Gigabit LAN port connects to routers, switches or computers for network image transmission. Computers within the same network segment can receive real-time video and trigger capture via matching software. |
| Frame Rate |
HDMI: 60fps @3840×2160 Gigabit LAN: 20fps @1920×1080 |
| Depth-of-Field Synthesis | / |
| Image Stitching | / |
| Measurement Method | Built-in on-monitor measurement system + PC-software measurement |
| Measurement Accuracy | 0.001 mm |
| Measurement Units | mm / μm / mil / inch (4 switchable units) |
| Measurement Tools | Length, angle, radian, circle, polygon, polyline, center-to-center distance, rectangle, annotation adding, automatic edge detection, scale bar and more |
| Storage Method | U-disk storage + PC-software storage |
| Display Language | Simplified Chinese / English (switchable) |
| Processor | ARM Cortex-A17 Quad-Core @ Max. 1.4 GHz main-control processor |
| Operating System | Independently-developed measurement firmware based on Linux 3.1 kernel |
| Image Naming | Automatic or manual naming available |
| Viewing Head | 30°-inclined hinge-type trinocular head; inter-pupillary adjustment range: 53-75 mm |
| Observation Modes | Bright-field / oblique illumination / simple polarization |
| Illumination System | Falling-light illumination system, 100-240V wide-voltage input, adjustable filament center, continuously-adjustable light intensity. |
| Stand |
① Shooting-type rack, coaxial coarse-fine focusing mechanism with locking and limiting devices;
fine-movement graduation value: 2 μm. Halogen-lamp reflected-light illumination. ② Bright-field reflector with variable aperture stop, field stop and color-filter switching unit. ③ Yellow, blue, green filters and frosted-glass sheet supplied for reflected-light optical path. |
| Mechanical Stage | Base dimension: 300 mm × 240 mm; Stage dimension: 185 mm × 140 mm; X-Y travel: 35 mm × 30 mm. Suitable for observing relatively high-height workpieces. |
| Light Source | 6V 30W halogen-lamp chamber (reflected light only). |
| Simple Polarization Function | Push-pull type polarizer and analyzer installed |
| Electronic Interface | 1X C-mount camera interface, non-adjustable focus; CTV 0.5X is optional with price-difference compensation. |
| Eyepieces | Two WF10X/22 mm wide-angle plan-field eyepieces with individual diopter adjustment |
| Nosepiece | ★Mingchang five-hole objective nosepiece |
| Metallurgical Objectives |
★Infinity-corrected plan-achromatic metallurgical objectives ① PL L5X/0.12, Working Distance: 26.1 mm ×1pc ② PL L10X/0.25, Working Distance: 20.2 mm ×1pc ③ PL L20X/0.40, Working Distance: 8.80 mm ×1pc ④ PL L50X/0.70, Working Distance: 3.68 mm ×1pc ⑤ PL L100X/0.85, Working Distance: 0.40 mm (optional, not included in standard package) |
| Optical Magnification | 50X, 100X, 200X, 500X (four-level switchable) |
| Electronic Magnification | Approx. 380X, 760X, 1520X, 3800X (four-level switchable); optional magnification range: 190-1900X. |
Disclaimer: Logos and names of enterprises, universities and research-institutions appearing on this website only indicate that such entities have purchased or utilized GAOPIN-brand microscopes. Their appearance shall not be construed as purchase of this exact product model, and shall not imply any commercial endorsement, co-branding, affiliation or joint-project partnership with these third-party organizations.
GAOPIN microscopes are used by leading enterprises, research institutes, and universities. Our collaborative relationships include:
Huawei Electronics – Incoming-material-inspection & production-line-QC for electronic-components
Zhejiang Maitong Intelligent Manufacturing Technology Co., Ltd. – Microscopic-dimensional-inspection for automated-precision-machined-parts
NIO Shanghai – Precision-inspection for new-energy-auto-parts & wiring-harnesses
Tsinghua University – Teaching, laboratory-imaging, and experimental-data-archiving
Dabo Medical – Micro-morphology-analysis of implant-medical-devices & biomaterials
Fudan University – Micro-nano-materials & biomedical microscopic-observation-research
Kunshan Gaopin Precision Instrument Co., Ltd. was officially founded in 2011. Our founding-team accumulated rich optical-inspection-instrument-industry-experience starting in 2005. We deliver full-cycle-services covering product-design, in-house-R&D, global-sales and comprehensive-after-sales-maintenance-services. Our skilled-engineering-team has more than ten-years of experience in optical-instrument-development to ensure stable-technical-performance and reliable-product-quality.
GAOPIN supplies more than one-hundred categories of optical-testing-instruments serving industrial-and-laboratory-clients worldwide. We develop flexible, cost-effective customized microscopy-solutions for diverse-industrial-quality-control and laboratory-analysis-projects.
For overseas-buyers, we provide responsive worldwide-technical-support including remote-online-consultations, practical- video-tutorials and live-remote-equipment-operation-training. Our production-facility locates in Kunshan, Jiangsu Province (close to Shanghai). On-site-factory-visits and virtual-online-tours are welcomed. Please contact our sales-team for authentic-sample-testing-photos captured by this Long Working Distance Metallurgical Microscope with 4K Ultra HD to evaluate real-imaging-performance.
A1: Equipped with dual interfaces of HDMI high-definition output and LAN port. It supports real-time imaging by connecting to a monitor directly, and computer connection via network cable. Without USB and WIFI interfaces, it supports both independent-operation and computer-collaborative-work.
A2: It supports 4K ultra-HD photo and video recording, and stores files via FAT32 U-disk (within 32G). It supports dual precise-measurement on screen and PC-software, including dimension-marking, data-saving and measurement-report-export functions, meeting precise-detection-and-filing requirements.
A3: Check the device power-supply and matched-adapter, fasten HDMI-cable firmly, switch monitor to corresponding-HDMI- signal-channel, restart device to fix black-screen and no-image-problems.
A4: Adopting high-precision manual-focus-design, slowly adjust focus-handwheel for clear-imaging. Lock objective-lens firmly, place sample flat, and regularly clean dust and stains on lens with professional-tools to ensure clear and accurate-imaging.
A5: Ensure the device and computer are set to same-IP-segment, turn-off-computer-firewall and interception-software, re-plug-network-cable firmly, reboot-device and supporting-measurement-software for normal-connection.
A6: The device only supports FAT32 U-disks within 32G, and does not support NTFS and exFAT large-capacity U-disks. For recognition-failure, re-plug or format-U-disk, or replace with compliant-U-disk for normal-file-storage.
Address
Building 2, Shuanglian International Business Center, Huaqiao Town, Kunshan City, China
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