Developed for material micro-inspection, this Metal Analysis Metallurgical Microscope with 4K Ultra HD is a high-performance Metal Analysis Metallurgical Microscope with 4K Ultra HD. Boasting premium infinity-corrected optics, it delivers crisp visuals for both transparent and opaque samples. Modular design supports flexible post-sale upgrades of bright-field and polarized-light functions. Reinforced anti-vibration chassis eliminates image offset under high magnification. User-friendly controls and spacious stage enable long-time continuous testing. Selectable combined modules cut whole-machine-replacement costs, ideal for professional industrial-inspection and metallurgical-analysis work.
4K camera integrated with trinocular metallurgical frame, enabling simultaneous eyepiece and screen viewing. Dual-output ports: HDMI & Gigabit-LAN for real-time ultra-clear micro-image capture.
Optical magnification 50-600 ×, max digital magnification 4560 × with four-speed objective-zoom. Precision optical-path captures tiny micro-details of semiconductors, powders and fiber specimens.
Thick cast-aluminum base guarantees balanced weight distribution, free of wobble or shift during long-duration slice-inspection and material-analysis.
Minimalist white-blue trinocular layout, professional lab aesthetic for research-laboratories and industrial quality-control workshops.
Well-suited for semiconductor-wafer testing, metal-metallographic analysis, powder-and-fiber observation, university-research and component-quality-testing.
Supports native 4K photo & video capture. Dual-measurement modes: built-in on-monitor measurement and PC-software-based measurement. Dual-storage: USB flash-drive local-storage + PC-software archiving. Depth-of-field stacking and image-stitching are available via PC-software; secondary-development-interface supported for convenient image-archiving, comparison and advanced-data-analysis.
Binocular viewing & synchronous electronic observation: Synchronized display between eyepiece and monitor. Ordinary metallurgical microscopes only support eyepiece-only viewing; extra camera accessories are required for screen output.
Native 4K ultra-high-definition imaging: Delivers 3840 × 2160 4K resolution. Most conventional metallurgical microscopes are limited to 1080P resolution.
Dual-output interfaces: HDMI + Gigabit-LAN network port. Traditional metallurgical devices mostly only have PC-USB connection, lacking network-transmission capability.
Dual-measurement modes: Offline built-in on-monitor measurement plus PC-software-based measurement. Ordinary metallurgical microscopes only support PC-side measurement without hardware-embedded measuring function.
Dual-storage modes: Offline USB-flash-drive storage and PC-software-storage; saving data with or without a host-PC. Conventional models require PC for image-storage.
Advanced image-processing functions on PC: Depth-of-field stacking and image-stitching functions are available through supporting PC-software. General metallurgical microscopes have no such algorithm-functions.
Secondary-development supported: Gigabit-LAN enables system-integration for automated-production-line deployment. General metallurgical microscopes cannot support secondary-development integration.
Modular expandable optical-path: Supports adding polarized-light and other observation-modules without replacing the whole unit. Ordinary digital microscopes lack dedicated metallurgical optical-path and cannot observe fine metallurgical-micro-structures.
Adopting a native 3840 × 2160 4K industrial imaging sensor and calibrated with national-standard metallurgical calibration slides, the device achieves high-fidelity restoration of microscopic morphologies such as metal grain structures, semiconductor-wafer micro-textures, powder-particle shapes and fiber-tissue characteristics. It realizes uniform full-field imaging definition without peripheral blur or signal attenuation.
Equipped with a four-stage objective variable-magnification system, the instrument covers a total magnification range of 380-4560 ×. It satisfies dual-application-requirements: low-power macroscopic full-view scanning and ultra-high-power microscopic-microstructure fine-analysis, fully applicable to university-scientific-research, material-analysis and industrial high-precision-quality-inspection.
The embedded professional metallurgical-measurement-module supports high-accuracy dimensional-computation and real-time graphical-annotation. It integrates one-click high-definition snapshot and long-time dynamic-video-recording functions. All inspection-data and image-files support export and permanent-archiving, providing valid-data-support for academic- experimental-reports and industrial-quality-traceability-systems.
The professional trinocular optical-tube realizes synchronous optical-eyepiece-observation and digital-display-imaging. The dual-path transmitted-and-reflected-illumination-system is compatible with opaque-metal-specimens, transparent-powder-fiber sliced-samples and semiconductor-wafer-materials. The precision XY-axis mechanical-moving-stage features ultra-smooth-transmission and high-positioning-accuracy, enabling efficient and precise-specimen-detection.
Semiconductor & Microelectronics: Silicon wafers, photolithography slices, IC chips, PCB boards, FPC flexible circuits. Inspection targets: Micro chip-circuits, coating-defects, wafer-flaws, cold-solder-defects, circuit-scratches and pin-deformation; observe micron-slice-structures under max 4560 × magnification.
Metallographic Metal Specimens: Metallographic slices, steel-alloys, drill bits, milling cutters, precision-stamped-hardware. Inspection targets: Metallographic-grain-structure-analysis, heat-treatment-material-identification; detect edge-chipping, micro-cracks, burrs and abrasion-depth.
Lab Samples: Powder & Fiber: Metal-powder, chemical-powder, carbon-fiber, textile-fiber, thin-film-materials. Inspection targets: Observe particle-morphology, fiber-texture, film-delamination and micro-material-structures.
Optoelectronic & Precision-Plastic Parts: LED chips, optical-lenses, injection-molded-parts, sealing-glue. Inspection targets: Detect micro-pores, surface-stains, rough-edges, glue-bubbles & tiny cosmetic-defects.
High-Precision Miniature Components: Connectors, terminals, micro-springs, miniature-stamped-workpieces. Inspection targets: Observe tiny-gaps and crimp-flatness; perform pixel-level precise-measurement of length, hole-diameter and pitch.
Laboratory & Industrial QC Archiving: Material-research-experiments, incoming-&-finished-goods sampling-inspection; photo-&-video-archiving for defective-evidence-records and export of formal-measurement QC reports.
Max 600 × optical magnification and up to 4560 × digital magnification with native 3840 × 2160 4K resolution. It clearly displays tiny-structures such as metal-grains, wafer-textures, ultra-thin-coatings and micro-cracks, ideal for high-standard-analysis of chips, new-materials and electroplated-parts.
Two-measurement-solutions: quick built-in on-monitor-measurement, high-precision professional-measurement via PC-software. Two-storage-methods: USB flash-drive local-saving and PC-batch-archiving for images & measurement-data.
Trinocular synchronous-optical-path enables simultaneous viewing via binocular-eyepieces and 4K-monitor. Multiple-operators can check the same-micro-sample together, perfect for university-material-teaching and QC-double-re-check and R&D-team-discussion to reduce misjudgment.
Professional metallurgical-stage with multiple-objectives fits metal-specimens, PCB-coatings, semiconductor-chips, mineral-slices and thin-film-materials. Coaxial coarse-and-fine manual-focusing with heavy-anti-vibration-body, stable for incoming-inspection, new-material-research and long-static-lab-analysis.
Equipped with Gigabit-LAN port, supports network-image-transmission and secondary-development-docking. Suitable for multi-station-lab-management and automated-factory-workstation integration-projects.
Neutral-packing shipment is available upon request.
| Entity | Description |
| Product | GP-L300-324K Metal Analysis Metallurgical Microscope with 4K Ultra HD |
| Category | Industrial Research-Grade Trinocular 4K High-Power Metallographic Inspection & Measuring Microscope |
| Core Technologies | Trinocular synchronous-observation optical-system, high-power dedicated metallurgical objective-lens-group, 4K ultra-high-definition CMOS imaging-sensor, dual-digital-measurement-engine (on-screen & PC-software), HDMI + Gigabit-LAN dual-channel-signal-transmission, dual-storage-technology, PC-side depth-of-field stacking & image-stitching algorithm, open-architecture supporting secondary-development |
| Key Specs | Visual magnification: 50/100/400/600 ×; Electronic magnification: 380/760/3040/4560 ×; Dual-output ports: HDMI + Gigabit-LAN; Capture-resolution: 3840 × 2160 (4K); Manual-focusing; Dual-measurement-modes: built-in on-device-measurement + professional-PC-software-measurement *(0.001 mm, Smaller measurement tolerance can be achieved under higher magnification. Results subject to calibration, magnification and sample conditions)*; Dual-storage: USB-flash-drive local-storage *(Only FAT32-formatted USB flash-drive up to 32 GB supported)* + computer-file-storage; Monitor-terminal supports HD-image-preview, dimensional-measurement, photo-&- video-capture; PC-terminal supports measurement, depth-of-field stacking, image-stitching and image-archiving, compatible with secondary-development-integration |
| Typical Applications | Semiconductor-wafer-inspection, metal-metallographic-structure-analysis, powder-&-fiber-microstructure- detection, alloy-grain-inspection, material-coating-thickness-testing, PCB cross-section-analysis, precision-electronic-component-failure-analysis, university-laboratory-new-material-research, new-energy-material-quality-control |
| Manufacturer | Kunshan Gaopin Precision Instrument Co., Ltd. |
| Manufacturer Location | Kunshan, Jiangsu, China (near Shanghai) |
| Product brand | GAOPIN |
| Product Model | GP-L300-324K |
| Resolution | 3840 × 2160 |
| Effective Pixels | 8.3-megapixel |
| Focusing method | Manual focus |
| Sensor optical format | 1/1.7" |
| Pixel size | 1.85 μm × 1.85 μm |
| Output interfaces | HDMI + Gigabit-LAN |
| Detailed functional introductions corresponding to each output interface |
① HDMI can connect to 4K displays, embedded professional image processing program, integrating functions
such as autofocus, photo recording, size measurement, image playback, image comparison, etc., with
real-time mouse operation. ② LAN Gigabit Ethernet port, which can be connected to routers, switches, or computers for network transmission of video images. Computers within the same network segment can simultaneously transmit images in real-time through image processing software and perform functions such as taking photos and storing them. |
| Frame rate |
HDMI: 60 fps @3840 × 2160 Gigabit-LAN: 20 fps @1920 × 1080 |
| Depth-of-field stacking | Available via PC-software only |
| Image-stitching | Available via PC-software only |
| Measurement operation | Built-in on-monitor measurement system + PC-software-based measurement |
| Measurement accuracy | 0.001 mm |
| Measurement units | mm / μm / mil / inch (4-way switchable) |
| Measurement tools | Length, angle, radius, circle, polygon, polyline, center-to-center distance, rectangle, annotation, auto-edge detection, scale bar |
| Storage method | USB flash-drive + PC-software storage |
| Image-naming mode | Automatic or manual image-file naming |
| Display language | Simplified Chinese / English (switchable) |
| Processor | ARM Cortex-A17 Quad-Core @ Max.1.4 GHz main-control processor |
| Firmware OS | Independently-developed measurement system built on Linux 3.1 kernel |
| Observation head | 30° inclined trinocular observation tube, 360° rotatable, adjustable interpupillary distance (53-75 mm) |
| Observation method | Bright-field / oblique-lighting / transmitted-lighting / simple polarization |
| Lighting system | Reflected & transmitted dual-path illumination system, 100-240 V wide-voltage; adjustable filament-center, continuously-adjustable light-intensity |
| Stand framework |
① Dual purpose frame for transmission and reflection, low hand position coarse and micro coaxial
focusing
mechanism. Coarse micro coaxial focusing, equipped with locking and limiting devices, micro grid value:
2um. Halogen lamp illumination. ② Bright field reflector with variable aperture stop, field stop, and color filter conversion device. ③ Configure blue filter and frosted glass sheet for reflection. |
| Mobile platform | Double-layer mechanical-moving stage; stage size: 210 × 140 mm; X-Y stroke: 75 × 50 mm; glass stage for transmitted & reflected observation |
| Light source | 6V-30W halogen-lamp for reflected-light; 12V-50W halogen-lamp for transmitted-light |
| Simple-polarization | 30° polarizer insert (reflected-light) + 360°-rotatable analyzer insert for polarized-observation |
| Electronic interface | 1X C-mount interface, non-adjustable focus [Optional: 0.5X C-mount for price-compensation] |
| Eyepiece | Two WF10X/22 mm wide-angle flat-field eyepieces (one eyepiece with scale mark) |
| Metallurgical objective lens |
★ Infinite flat field achromatic objective lens ① PL L5X/0.12 working distance: 26.1 mm per piece; ② PL L10X/0.25 working distance: 20.2 mm 1 piece ③ PL L40X/0.60 working distance: 3.98 mm per piece; ④ PL L60X/0.70 working distance: 3.18 mm 1 piece ⑤ PL L100X/0.85 working distance: 0.40 mm 0 pieces [standard not included optional] |
| Optical magnification | 50 ×, 100 ×, 400 ×, 600 × four-level adjustable |
| Electronic magnification | Approx. 380 ×, 760 ×, 3040 ×, 4560 × four-level adjustable (expandable to 190-2280 ×) |
GAOPIN microscopes are used by leading enterprises, research institutes, and universities. Our collaborative relationships include:
Shanghai Institute of Optics and Fine Mechanics, CAS – Advanced-optical-research & optical-component-characterization
DOOV – Mobile-device-assembly-inspection, screen & component-appearance-testing
NIO Shanghai – Precision-inspection for new-energy-auto-parts & wiring-harness-assemblies
Beijing Institute of Technology – Scientific-research-analysis for military-grade-materials and optoelectronic-devices
GREE Electric Appliances (Hefei) – Precision-dimension-measurement & defect-inspection for home-appliance-components
Technical Institute of Physics and Chemistry, CAS – Microscopic-research on low-temperature & special-functional-materials
Objective & Eyepiece: Blow off dust with an air blower, then wipe lenses gently with lens paper and lens cleaner. Never touch optical lenses with bare hands or use ordinary paper towels for cleaning.
Main Body & Stage: Clear sample debris and metallurgical-powder promptly. Wipe the housing with a dry soft cloth; avoid liquid splashes. Regularly check that stage screws are tight to prevent shifting caused by collisions.
Transmitted & Reflected Light Source: Turn off the light source when the microscope is idle. Blow dust off the light window and do not touch the bulb directly.
Mechanical Focus Mechanism: Do not twist the focus handwheel with excessive force. Keep sliding tracks clean; never lubricate them by yourself.
Storage Environment: Store in a dry, well-ventilated space to resist moisture and mold. Cover the device with a dust cover after use.
Software & Calibration: Calibrate the measuring scale before performing measurements. Fully close associated software before cutting off power. Do not disassemble the unit without authorization; contact after-sales-service support in case of malfunctions.
A1: Visual magnification: 50-600 ×; Electronic magnification: 380-4560 ×. Synchronous viewing via eyepiece and monitor is available.
A2: It supports HDMI video-output and Gigabit-LAN port. It can connect directly to monitor, or access the camera via LAN network with a computer.
A3: Capture resolution: 3840 × 2160 (4K). It supports built-in on-screen-measurement and PC-software-based measurement. Files can be saved to USB flash-drive or via PC-software.
A4: ①Check power-supply for microscope; ②Ensure HDMI cable is firmly connected; ③Select correct HDMI input-source on monitor; ④Restart microscope host.
A5: ①Connect network-cable between device and switch / PC; ②Set PC-IP to the same network-segment as camera; ③Turn off PC-firewall; ④Verify device-IP-settings and reconnect.
A6: This model adopts manual-focus design. Rotate focus-handwheel slowly. Make sure objective-lens clicks in-place. Place sample flat and clean dust on objective-lens.
A7: Use FAT32-formatted USB flash-drive within 32 GB capacity. Re-insert or format USB flash-drive for retry.
A8: Yes, secondary-development is supported. Suitable for metallographic-analysis, metal-materials, powder-metallurgy, semiconductor-components-observation, scientific-research and teaching-scenarios.
Kunshan Gaopin Precision Instrument Co., Ltd., founded in 2011 whose founder has accumulated industry expertise since 2005, is a tech-focused enterprise specializing in the design, R&D, sales and after-sales service of industrial microscopes. Our core engineering team brings over ten years of specialized experience, ensuring mature technology and reliable quality. With more than one hundred optical-product models and a global customer base, GAOPIN continuously delivers tailor-made, cost-effective microscopy solutions. We provide fast-response global technical support through online conferences, video-assisted guidance, and remote training sessions. Our manufacturing base is located in Kunshan, Jiangsu Province (close to Shanghai). Both on-site factory inspections and virtual plant tours are available for clients. Feel free to get in touch with us for sample test images captured by this GP-L300-324K Metal Analysis Metallurgical Microscope with 4K Ultra HD to evaluate imaging performance firsthand.
Address
Building 2, Shuanglian International Business Center, Huaqiao Town, Kunshan City, China
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